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TFT MIS METHOD AND SYSTEM FOR CONTROLLING MIS STRUCTURE DESIGN IN TFT

机译:TFT MIS中用于控制MIS结构设计的方法和系统

摘要

The control method of the MIS structure in the TFT design and system obtain by calculating the dielectric constant of the silicon nitride in the design MIS structure; But determines if the dielectric constant of silicon nitride, up to the set value of the TFT manufacturing process, wherein the determining if the result is not a set value, by adjusting a parameter of the MIS structure, the dielectric constant of the silicon nitride in the control MIS structure TFT manufacturing process and a step of so as to reach the value of the set. The method and system can effectively control the MIS structure design, improve the TFT-LCD product performance and stability.;
机译:通过计算设计MIS结构中氮化硅的介电常数得到TFT设计和系统中MIS结构的控制方法;而是确定氮化硅的介电常数是否达到TFT制造工艺的设定值,其中通过调整MIS结构的参数来确定氮化硅的介电常数是否达到设定值。控制MIS结构的TFT的制造工艺和步骤以达到设定值。该方法和系统可以有效地控制MIS结构设计,提高TFT-LCD产品的性能和稳定性。

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