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Multi-port optical probes for photonic IC characterization and packaging
Multi-port optical probes for photonic IC characterization and packaging
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机译:用于光子IC表征和封装的多端口光学探头
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摘要
Improved passive optical coupling to photonic integrated circuit (PIC) chips is provided. An interposer unit 108 having one or more flexible optical waveguide members 112, 114, 116 is employed. The flexible optical waveguide members are coupled to the PIC chip 118 through their respective tips. The PIC chip includes alignment features to enable lateral, vertical, and longitudinal passive alignment of the flexible optical waveguide members to the on-chip optical waveguides of the PIC chip.;
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