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CONTACT-TYPE POSITION MEASUREMENT DEVICE AND MEASUREMENT METHOD USING SAME
CONTACT-TYPE POSITION MEASUREMENT DEVICE AND MEASUREMENT METHOD USING SAME
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机译:接触式位置测量装置和使用该方法的测量方法
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摘要
[Object] To provide a contact-type position measuring device which prevents an increase in cost and a deterioration of workability, and improves the measuring accuracy of a chamfered hole. [Means to solve the problems] A contact-type position measuring device 7 is configured by a straight hole diameter measuring probe 12 measuring a diameter of straight hole D1 by moving in a radius direction and contacting to an internal peripheral surface of a straight hole W1, which extends to an axis direction; and a chamfered hole diameter measuring probe 13 measuring a diameter of chamfered hole D2 by moving in the axis direction and contacting to an internal peripheral surface of a chamfered hole W2.
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