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AN ASSESSMENT SYSTEM AND METHOD FOR DETERMINING AT LEAST ONE OF MACRO-TOPOLOGY, MILLI-TOPOLOGY, MICRO-TOPOLOGY AND NANO-TOPOLOGY
AN ASSESSMENT SYSTEM AND METHOD FOR DETERMINING AT LEAST ONE OF MACRO-TOPOLOGY, MILLI-TOPOLOGY, MICRO-TOPOLOGY AND NANO-TOPOLOGY
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机译:用于确定宏观,微观,微拓扑和纳米拓扑中的至少一个的评估系统和方法
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摘要
An assessment method is disclosed to determine at least one of macro-topology, milli-topology, micro-topology and nano-topology of at least one interface of at least two media using topology of the interface. Topology information of the interface is processed by performing segmentation of volume information of the obtained information from background information of the obtained information. Reference surface information is generated and information on voids is obtained and analyzed to provide multivalued surface shape information. Quantitative mapping of the information on voids is performed using the multivalued surface shape information for determining at least one of macro-topology, milli-topology, micro-topology and nano-topology of the interface.
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