首页> 外国专利> SURFACE PLASMON-ENHANCED FLUORESCENCE MEASUREMENT DEVICE AND SURFACE PLASMON-ENHANCED FLUORESCENCE MEASUREMENT METHOD

SURFACE PLASMON-ENHANCED FLUORESCENCE MEASUREMENT DEVICE AND SURFACE PLASMON-ENHANCED FLUORESCENCE MEASUREMENT METHOD

机译:表面等离子增强荧光测量装置及表面等离子增强荧光测量方法

摘要

The surface plasmon-enhanced fluorescence measurement device has: a light source that irradiates the diffraction grating with a linearly polarized excitation light; a rotating part that changes the direction of the optical axis of the excitation light with respect to the diffraction grating when seen in plan view, or changes the polarization direction of the excitation light with respect to the diffraction grating; a polarizer that extracts linearly polarized light from the fluorescence emitted from the fluorescent substance; and a light detection unit that detects the linearly polarized light extracted by the polarizer.
机译:所述表面等离子体激元增强的荧光测量装置具有:光源,其以线性偏振的激发光照射所述衍射光栅。旋转部,其俯视时改变激发光相对于衍射光栅的光轴方向,或者改变激发光相对于衍射光栅的偏振方向。偏振器,其从荧光物质发出的荧光中提取线偏振光。光检测单元检测由偏振器提取的线偏振光。

著录项

  • 公开/公告号EP3236242A4

    专利类型

  • 公开/公告日2017-12-06

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA INC.;

    申请/专利号EP20150869789

  • 申请日2015-12-01

  • 分类号G01N21/64;

  • 国家 EP

  • 入库时间 2022-08-21 13:16:07

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