首页> 外国专利> METHOD FOR OPTIMALLY ADJUSTING GIVE ERROR BOUNDS OR FOR OPTIMALLY CALCULATING RESIDUAL VARIANCES OF IGP POINTS OF AN IONOSPHERIC GRID FOR CORRECTING AN SBAS SYSTEM AND SBAS SYSTEM FOR CARRYING OUT SAID METHOD

METHOD FOR OPTIMALLY ADJUSTING GIVE ERROR BOUNDS OR FOR OPTIMALLY CALCULATING RESIDUAL VARIANCES OF IGP POINTS OF AN IONOSPHERIC GRID FOR CORRECTING AN SBAS SYSTEM AND SBAS SYSTEM FOR CARRYING OUT SAID METHOD

机译:校正SBAS系统和SBAS系统的最优调节误差界限或最优计算离子网格的IGP点残差的方法。

摘要

A method of optimally adjusting GIVE ionospheric correction error terminals and / or a method for calculating IGP dot residue variances of an ionospheric correction grid of an SBAS system each comprises a reverse interpolation step ( 220) implemented on a set of observation IPPi piercing points. In the optimal GIVE adjustment method, the inverse interpolation step (220) disseminates for each observation piercing point IPPi concerned a variance increment "UIVE i 2 on the IGP points of the mesh of said IPPi using a least squares method. In the calculation of the residue variances, the inverse interpolation step disseminates for each IPPi observation piercing point concerned a Resf residue on the IGP points of the mesh of said IPPi using a least squares method.
机译:最优地调节GIVE电离层校正误差端子的方法和/或用于计算SBAS系统的电离层校正网格的IGP点残差方差的方法均包括在一组观测IPPi穿透点上实现的反向插值步骤(220)。在最佳GIVE调节方法中,逆内插步骤(220)使用最小二乘法为每个观察到的观察穿刺点IPPi散布所述IPPi的网格的IGP点上的方差增量“ UIVE i 2”。残差方差,逆插值步骤使用最小二乘法为每个IPPi观察穿刺点散布有关该IPPi网格的IGP点上的Resf残差。

著录项

  • 公开/公告号EP3343247A1

    专利类型

  • 公开/公告日2018-07-04

    原文格式PDF

  • 申请/专利权人 THALES;

    申请/专利号EP17205745.7

  • 申请日2017-12-06

  • 分类号G01S19/07;

  • 国家 EP

  • 入库时间 2022-08-21 13:15:06

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