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CIRCUIT BOARD TEST SYSTEM, CIRCUIT BOARD TEST METHOD AND CIRCUIT BOARD CLAMPING DEVICE

机译:电路板测试系统,电路板测试方法和电路板钳位装置

摘要

PROBLEM TO BE SOLVED: To provide a circuit board test system.SOLUTION: A circuit board test system comprises: a test device that has a test stage, and is arranged so as to conduct tests to circuit boards placed in the test stage; a buffer stage that is located out of the test device; two clamp jigs that are placed in the test stage and the buffer stage, respectively, and are arranged so as to clamp the single circuit board, respectively; an ejection/retracting device that includes two ejection/retracting modules moving between the test stage and the buffer stage respectively, and are arranged so as to eject or retract one jig in the clamp jigs; and one or more controllers that is arranged to actuate the ejection/retracting module so as to interchange an arrangement position of the clamp jigs after the test is conducted to the circuit board to be placed in the test stage in the test device.SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种电路板测试系统。解决方案:一种电路板测试系统包括:具有测试台的测试设备,该测试设备布置成对放置在该测试台上的电路板进行测试;位于测试设备之外的缓冲级;分别放置在测试台和缓冲台的两个夹具,分别配置为夹持单个电路板;弹出/退回装置,包括两个分别在测试台和缓冲台之间移动的弹出/退回模块,并且被布置为弹出或缩回夹具中的一个夹具。以及一个或多个控制器,其被配置为致动弹出/缩回模块,以便在将测试进行到要放置在测试装置中的测试台中的电路板之后互换夹具的布置位置。图1

著录项

  • 公开/公告号JP2018159695A

    专利类型

  • 公开/公告日2018-10-11

    原文格式PDF

  • 申请/专利权人 TEST RESEARCH INC;

    申请/专利号JP20170118970

  • 发明设计人 PAN YI HUA;TSAO YI;CHEN HEIEN HUNG;

    申请日2017-06-16

  • 分类号G01R31/28;

  • 国家 JP

  • 入库时间 2022-08-21 13:14:31

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