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INTERREFLECTION DETECTION DEVICE, INTERREFLECTION DETECTION METHOD, AND PROGRAM

机译:交叉检测装置,交叉检测方法和程序

摘要

PROBLEM TO BE SOLVED: To appropriately detect an area in which interreflection is occurring.SOLUTION: An interreflection detection device comprises: irradiating means that irradiates light of a sinusoidal wave pattern in which a frequency is variable; image acquisition means that acquires an image of an object irradiated by the light from the irradiating means; phase determination means that determines a phase for each position from the image; and detection means that detects an area in which interreflection is occurring. The detection means obtains a phase difference between the phase obtained from the image on which a low frequency sinusoidal wave pattern is irradiated and the phase obtained from the image on which a high frequency sinusoidal wave pattern is irradiated, for a combination of a plurality of low frequencies and high frequencies, and determines that the interreflection is occurring in the area in which the phase difference for any of the plurality of combinations is more than or equal to a threshold value.SELECTED DRAWING: Figure 7
机译:解决的问题:为了适当地检测发生相互反射的区域。解决方案:一种相互反射检测装置包括:照射装置,其照射频率可变的正弦波形的光;图像获取装置,获取由来自照射装置的光照射的物体的图像。相位确定装置,其从图像确定每个位置的相位;检测装置检测发生相互反射的区域。对于多个低频率的组合,检测装置获得从照射了正弦波模式的图像获得的相位与从照射了正弦波模式的图像获得的相位之间的相位差。频率和高频,并确定在多个组合中任何一个的相位差大于或等于阈值的区域中发生了相互反射。图7

著录项

  • 公开/公告号JP2018146476A

    专利类型

  • 公开/公告日2018-09-20

    原文格式PDF

  • 申请/专利权人 OMRON CORP;

    申请/专利号JP20170043668

  • 发明设计人 ONISHI YASUHIRO;

    申请日2017-03-08

  • 分类号G01B11/25;

  • 国家 JP

  • 入库时间 2022-08-21 13:14:04

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