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INTERREFLECTION DETECTION DEVICE, INTERREFLECTION DETECTION METHOD, AND PROGRAM

机译:交叉检测装置,交叉检测方法和程序

摘要

Provided is an interreflection detection device comprising: an radiation means that radiates light of variable-frequency sinusoidal wave patterns; an image acquisition means that acquires an image of an object irradiated with the light from the radiation means; a phase determination means that determines, from the image, the phase at each of multiple positions; and a detection means that detects a region in which interreflection is occurring. The detection means calculates, for a plurality of combinations of low frequency and high frequency, a phase difference between a phase obtained from an image acquired when radiating a low frequency sinusoidal wave pattern and a phase obtained from an image acquired when radiating a high frequency sinusoidal wave pattern, and determines that interreflection is occurring in a region in which the phase difference for one of the plurality of combinations is at or above a threshold.
机译:提供一种相互反射检测装置,包括:辐射装置,其辐射变频正弦波图案的光;以及图像获取装置,获取从辐射装置照射的光所照射的物体的图像。相位确定装置,其从图像确定多个位置中的每个位置处的相位;检测装置检测发生相互反射的区域。检测装置针对低频和高频的多个组合,计算从辐射低频正弦波图案时获取的图像获得的相位与从辐射高频正弦波时获取的图像获得的相位之间的相位差。波形,并确定在多个组合之一的相位差等于或大于阈值的区域中发生互反射。

著录项

  • 公开/公告号WO2018163537A1

    专利类型

  • 公开/公告日2018-09-13

    原文格式PDF

  • 申请/专利权人 OMRON CORPORATION;

    申请/专利号WO2017JP42601

  • 发明设计人 OHNISHI YASUHIRO;

    申请日2017-11-28

  • 分类号G01B11/25;

  • 国家 WO

  • 入库时间 2022-08-21 12:42:44

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