首页> 外国专利> DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, MANUFACTURING METHOD OF SEPARATOR WOUND-BODY, AND SEPARATOR WOUND-BODY

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, MANUFACTURING METHOD OF SEPARATOR WOUND-BODY, AND SEPARATOR WOUND-BODY

机译:缺陷检查装置,缺陷检查方法,分离器体的制造方法以及分离器体

摘要

PROBLEM TO BE SOLVED: To inspect existence of a defect inside a separator wound-body by a small number of defect inspection devices after slit of a separator used for a battery.SOLUTION: A defect inspection device 1 has a radiation source part 2 having a retention mechanism 20 for retaining a separator wound-body 10 wound after slit, the radiation source part 2 configured to apply an electromagnetic wave such as an x-ray or a gamma-ray to the separator wound-body, and a sensor assembly 3 configured to detect an electromagnetic wave applied from the radiation source part and transmitted through the separator wound-body. A structure is not arranged between the separator wound-body and a detection surface 3a of the sensor assembly.SELECTED DRAWING: Figure 3
机译:解决的问题:在将用于电池的隔膜切开后,通过少量的缺陷检查装置来检查隔膜卷绕体内部是否存在缺陷。解决方案:缺陷检查装置1具有放射线源部2,该放射线源部2具有放射线照射部2。用于保持切开后缠绕的分离器伤口体10的保持机构20,构造成向分离器伤口体施加诸如X射线或γ射线的电磁波的放射线源部2以及构造成的传感器组件3检测从放射线源部施加并通过隔板卷绕体传播的电磁波。在隔板的卷绕体与传感器组件的检测面3a之间未设置结构。选择图:图3

著录项

  • 公开/公告号JP2018091825A

    专利类型

  • 公开/公告日2018-06-14

    原文格式PDF

  • 申请/专利权人 SUMITOMO CHEMICAL CO LTD;

    申请/专利号JP20170129780

  • 发明设计人 SHINOMIYA YOSHITAKA;KASHU KOJI;

    申请日2017-06-30

  • 分类号G01N23/18;G01N23/04;H01M2/16;H01M2/14;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:41

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号