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REACTIVE SPUTTERING FILM DEPOSITION APPARATUS AND FILM DEPOSITION METHOD

机译:反应溅射膜沉积装置和膜沉积方法

摘要

PROBLEM TO BE SOLVED: To provide a technology capable of obtaining a stable film quality for a long period of time even when a film is consecutively deposited on multiple substrates by controlling a film deposition rate with a reactive sputtering method.SOLUTION: A reactive sputtering film deposition apparatus for depositing a film in either a chemical compound mode, a transition mode, or a metal mode using a target 3 and reactive gas. The apparatus has an introduction part 6 for introducing inert gas, an introduction part 7 for introducing reactive gas, and an electric power supply part 8 for supplying electric power to the target. In addition, the apparatus includes a detection part for detecting a plasma emission generated by supplying electric power to the target, and a control part 14 for adjusting a flow rate of reaction gas such that an emission intensity of a predetermined wavelength or an emission intensity calculation value of multiple wavelengths is maintained to be a designated value. The control part corrects the above designated value such that V/Vc, a ratio of a cathode voltage V of the electric power supply part which is detected during film deposition, and a cathode voltage Vc in the chemical compound mode becomes close to a predetermined value.SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种即使通过连续溅射法控制成膜速度,即使在多个基板上连续成膜的情况下,也能够长期稳定地获得膜品质的技术。沉积设备,用于使用靶材3和反应性气体以化学模式,过渡模式或金属模式沉积膜。该设备具有用于引入惰性气体的引入部6,用于引入反应性气体的引入部7,以及用于向靶材供应电力的电源部8。另外,该设备包括:检测部分,用于检测通过向目标供给电力而产生的等离子体发射;以及控制部分14,其用于调节反应气体的流量,使得预定波长的发射强度或发射强度计算多个波长的值保持为指定值。控制部校正上述指定值,以使得V / Vc,在成膜期间检测到的电源部的阴极电压V与化合物模式下的阴极电压Vc之比接近预定值。 .SELECTED DRAWING:图1

著录项

  • 公开/公告号JP2018150590A

    专利类型

  • 公开/公告日2018-09-27

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20170047967

  • 发明设计人 HIROKI TAMAYO;

    申请日2017-03-14

  • 分类号C23C14/34;H05H1/46;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:33

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