首页> 外国专利> STRESS CONTROL APPARATUS, MAGNETIC CHARACTERISTICS MEASURING APPARATUS, STRESS CONTROL METHOD AND MAGNETIC CHARACTERISTICS MEASURING METHOD

STRESS CONTROL APPARATUS, MAGNETIC CHARACTERISTICS MEASURING APPARATUS, STRESS CONTROL METHOD AND MAGNETIC CHARACTERISTICS MEASURING METHOD

机译:应力控制装置,磁特性测量装置,应力控制方法和磁特性测量方法

摘要

PROBLEM TO BE SOLVED: To provide a magnetic characteristics measuring apparatus and a magnetic characteristics measuring method which have a simple structure and are capable of highly accurately measuring magnetic characteristics, and a stress control apparatus and a stress control method suitable therefor.;SOLUTION: On one surface of a tabular sample 10, stress application means including a piezoelectric film 14 and a piezoelectric film 16 which apply isotropic stress in an in-plane direction to the sample 10 is provided, first voltage is applied to the piezoelectric film 14, second voltage is applied to the piezoelectric film 16, whether or not displacement of the sample 10 in a thickness direction is within a predetermined range is determined, and the first voltage and the second voltage are adjusted until the displacement of the sample 10 in the thickness direction falls into a predetermined range based on the determination result. The displacement of the sample 10 in the thickness direction is brought into a predetermined range, magnetic field is applied to the sample 10, magnetic field is measured by magnetic field sensors 70a, 70b provided on the other surface of the sample 10, and magnetic characteristics of the sample 10 are detected in the state where stress is applied to the sample 10 by the stress application means. The sample 10 is a sample of a magnetic material.;SELECTED DRAWING: Figure 8;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:提供一种结构简单且能够高精度地测量磁特性的磁特性测量装置和磁特性测量方法,以及适用于此的应力控制装置和应力控制方法。设置板状样品10的一个表面,设置应力施加装置,该应力施加装置包括在面内方向上向样品10施加各向同性应力的压电膜14和压电膜16,对压电膜14施加第一电压,第二电压在压电体膜16上施加电压后,判断样品10的厚度方向的位移是否在预定范围内,调整第一电压和第二电压,直到样品10的厚度方向的位移下降为止。根据确定结果进入预定范围。使样品10在厚度方向上的位移处于预定范围内,对样品10施加磁场,通过设置在样品10的另一面上的磁场传感器70a,70b测定磁场,并测定磁特性。在通过应力施加装置将应力施加到样品10的状态下,检测样品10的α。样品10是磁性材料的样品。;选定的图纸:图8;版权:(C)2018,JPO&INPIT

著录项

  • 公开/公告号JP2018009809A

    专利类型

  • 公开/公告日2018-01-18

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20160136920

  • 发明设计人 KAWANO HIROYASU;

    申请日2016-07-11

  • 分类号G01R33/02;G01R33/07;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:09

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