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TEST AND MEASUREMENT INSTRUMENT, AND METHOD OF TRAINING TEST AND MEASUREMENT INSTRUMENT TO SUGGEST MEASUREMENTS

机译:测试和测量仪器,以及训练测试和测量仪器以进行建议的测量的方法

摘要

PROBLEM TO BE SOLVED: To allow for suggesting appropriate measurements by classifying input waveforms.SOLUTION: An oscilloscope 200 includes an input port 215 for receiving training data including waveforms and corresponding known classifications, and a processor 212 for training a plurality of classifiers on the training data. Training involves iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications, and comparing the predicted waveform classifications with known classifications. The classifiers are corrected when the predicted waveform classifications do not match the known classifications. Models for each classification are constructed with suggested measurements or actions. Subsequently, live waveform data is captured by the oscilloscope 200 and the classifiers are applied to live data. When a confidence value for a single classification exceeds a threshold, the waveform data is classified, and suggested measurements or actions are implemented in the oscilloscope 200 on the basis of the classification.SELECTED DRAWING: Figure 2
机译:解决的问题:允许通过对输入波形进行分类来建议适当的测量。解决方案:示波器200包括一个输入端口215,用于接收包括波形和相应的已知分类的训练数据,以及处理器212,用于对训练中的多个分类器进行训练。数据。训练涉及将每个分类器迭代地应用于训练数据的每个波形以获得对应的预测波形分类,并将预测波形分类与已知分类进行比较。当预测波形分类与已知分类不匹配时,对分类器进行校正。每种分类的模型都带有建议的度量或操作。随后,通过示波器200捕获实时波形数据,并且将分类器应用于实时数据。当单个分类的置信度值超过阈值时,对波形数据进行分类,并根据该分类在示波器200中执行建议的测量或操作。选定的图:图2

著录项

  • 公开/公告号JP2018059912A

    专利类型

  • 公开/公告日2018-04-12

    原文格式PDF

  • 申请/专利权人 TEKTRONIX INC;

    申请/专利号JP20170173708

  • 发明设计人 IAN R ABSHER;KRAIG M STRONG;

    申请日2017-09-11

  • 分类号G01R13/20;G01R31/28;G06N99;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:07

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