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ACCESSORY FOR USE IN TEST AND MEASUREMENT INSTRUMENT AND METHOD FOR TEST AND MEASUREMENT INSTRUMENT

机译:用于测试和测量仪器的附件以及用于测试和测量仪器的方法

摘要

PROBLEM TO BE SOLVED: To make it possible to measure signals to be measured of small amplitudes in a high sensitivity setting, without saturating an oscilloscope.SOLUTION: A probe 201 is used with an oscilloscope 208 and receives an input signal from a device under test (DUT) 202. A clamp control unit 210 applies clamping/limiting levels 212, 214 to the input signal via diodes 213, 215, respectively. A buffer 216 supplies a clamped/limited output signal to the oscilloscope 208. When the vertical sensitivity of the oscilloscope 208 exceeds a predetermined threshold value, the clamp control unit 210 may be controlled from the oscilloscope 208 to enable the clamping/limiting levels so as to prevent the front end of the oscilloscope 208 from being driven to a saturation condition.SELECTED DRAWING: Figure 2
机译:解决的问题:为了能够在不使示波器饱和的情况下在高灵敏度设置下测量小幅度的待测信号解决方案:探头201与示波器208一起使用并从被测设备接收输入信号(DUT)202。钳位控制单元210分别通过二极管213,215将钳位/限制电平212,214施加到输入信号。缓冲器216将钳位/限制的输出信号提供给示波器208。当示波器208的垂直灵敏度超过预定阈值时,可以从示波器208控制钳位控制单元210以启用钳位/限制水平,从而以防止示波器208的前端被驱动到饱和状态。图2

著录项

  • 公开/公告号JP2017211364A

    专利类型

  • 公开/公告日2017-11-30

    原文格式PDF

  • 申请/专利权人 TEKTRONIX INC;

    申请/专利号JP20170035436

  • 申请日2017-02-27

  • 分类号G01R13/20;G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-21 13:10:45

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