SELF-TESTABLE INTEGRATED CIRCUIT DEVICE AND METHOD FOR SELF-TESTING INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a method for self-testing a testable logic.SOLUTION: A testable logic 206 includes multiple scan channels 202-204 coupled operatively between a pattern generator 200 and a result store 205. A self-test controller 118 is configured to generate self-test result data, and to supervise the self-test related to a testable logic, and the self-test result data is stored in the result store. A process resource 108 is also coupled operatively to the self-test controller, and coupled operatively between a pattern generator 212 and the result store, and can evaluate the self-test result data stored in the result store. The process resource is configured to cooperate with the self-test controller, so that the self-test is also related to the process resource, and the process resource can evaluate the self-test result data after self test.SELECTED DRAWING: Figure 2