首页> 外国专利> Method and detector for reducing extrinsic dark count in nanowire single photon detectors

Method and detector for reducing extrinsic dark count in nanowire single photon detectors

机译:减少纳米线单光子探测器中外部暗计数的方法和探测器

摘要

Provided are a method and device for reducing the extrinsic dark count of a superconducting nanowire single photon detector (SNSPD), comprising the steps of: integrating a multi-layer film filter on the superconducting nanowire single photon detector; wherein, the multi-layer film filter is a device implemented by a multi-layer dielectric film and having a band-pass filtering function. The extrinsic dark count is the dark count triggered by optical fiber blackbody radiance and external stray light. The superconducting nanowire single photon detector comprises: a substrate having an upper surface integrated with an upper anti-reflection layer and a lower surface integrated with a lower anti-reflection layer; an optical cavity structure; a superconducting nanowire; and a reflector. The present invention is easy to operate, and only needs to integrate the multi-layer film filter on the substrate of the SNSPD to filter non-signal radiation. The method effectively reduces the extrinsic dark count while ensuring the signal radiation and the optical coupling efficiency of a device, thereby improving the detection efficiency of the device in dark count specific conditions.
机译:提供了一种用于减少超导纳米线单光子检测器(SNSPD)的外在暗计数的方法和装置,包括以下步骤:在该超导纳米线单光子检测器上集成多层膜滤光器;其中,所述多层膜滤光片是由多层介电膜实现并具有带通滤波功能的装置。外部暗计数是由光纤黑体辐射和外部杂散光触发的暗计数。该超导纳米线单光子检测器包括:衬底,该衬底的上表面与上抗反射层集成在一起,而下表面与下抗反射层集成在一起;光腔结构;超导纳米线;和一个反射器。本发明易于操作,仅需要在SNSPD的基板上集成多层薄膜滤光片即可滤除无信号辐射。该方法有效地减少了外部暗计数,同时确保了设备的信号辐射和光耦合效率,从而提高了暗计数特定条件下设备的检测效率。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号