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Investigation of the Performance of an Ultralow-Dark-Count Superconducting Nanowire Single-Photon Detector

机译:超低暗计数超导纳米线单光子探测器性能研究

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摘要

The realization of an ultralow-dark-count rate (DCR) along with the conservation of high detection efficiency (DE) is critical for many applications using single photon detectors in quantum information technologies, material sciences, and biological sensing. For this purpose, a fiber-coupled superconducting nanowire single-photon detector (SNSPD) with a meander-type niobium nitride nanowire (width: 50 nm) is studied. Precise measurements of the bias current dependence of DE are carried out for a wide spectral range (from 500 to 1650nm in steps of 50 nm) using a white light source and a laser line Bragg tunable band-pass filter. An ultralow DCR (0.0015 cps) and high DE (32%) are simultaneously achieved by the SNSPD at a wavelength of 500 nm.
机译:超低暗计数率(DCR)的实现以及高检测效率(DE)的保存对于在量子信息技术,材料科学和生物传感中使用单光子检测器的许多应用至关重要。为此,研究了具有曲折型氮化铌纳米线(宽度:50 nm)的光纤耦合超导纳米线单光子探测器(SNSPD)。使用白光源和激光线布拉格可调带通滤波器,可以在宽光谱范围(从500至1650nm,以50 nm为步长)内对DE的偏置电流依赖性进行精确测量。 SNSPD在500 nm波长处同时实现了超低DCR(0.0015 cps)和高DE(32%)。

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  • 来源
    《Japanese journal of applied physics》 |2013年第10issue1期|102801.1-102801.5|共5页
  • 作者单位

    Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan,The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan;

    Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan,The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan;

    Research Institute of Superconductor Electronics, Nanjing University, Nanjing 210093, China;

    Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan,The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan;

    Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan,The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan;

    Research Institute of Superconductor Electronics, Nanjing University, Nanjing 210093, China;

    Research Institute of Superconductor Electronics, Nanjing University, Nanjing 210093, China;

    Research Institute of Superconductor Electronics, Nanjing University, Nanjing 210093, China;

    Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan,The Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka 567-0047, Japan;

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