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Gas concentration thickness product measuring apparatus, gas concentration thickness product measuring method, gas concentration thickness product measuring program, and computer readable recording medium recording gas concentration thickness product measuring program
Gas concentration thickness product measuring apparatus, gas concentration thickness product measuring method, gas concentration thickness product measuring program, and computer readable recording medium recording gas concentration thickness product measuring program
Provided is a gas concentration length measurement device into which image data (moving image data) representing a plurality of infrared images is input, the image data being obtained by taking infrared images of a gas leakage monitoring target at a plurality of times. The gas concentration length measurement device generates chronological pixel data in which pieces of pixel data for pixels that are at the same positions in the plurality of infrared images are arranged chronologically, then uses the chronological pixel data for a predetermined pixel among the plurality of pixels constituting the infrared images as a basis to determine a with-gas background temperature indicating the background temperature when a gas is present in a predetermined region corresponding to the predetermined pixel and a without-gas background temperature indicating the background temperature when gas is not present in the predetermined region.
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