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Surge testing apparatus, surge testing method and electronic parts

机译:浪涌测试装置,浪涌测试方法和电子零件

摘要

PROBLEM TO BE SOLVED: To ensure detecting that specified surge electric power is applied to a test target element.SOLUTION: A surge test apparatus includes: a surge-voltage generation circuit SC applying a surge voltage; a first test terminal T1 connected to an output of the surge-voltage generation circuit SC; a second test terminal T2 that is grounded; a voltage detector VD detecting the surge voltage applied from the surge-voltage generation circuit SC to a test target element connected between the first test terminal T1 and the second test terminal T2 so as to be reversely biased, and having avalanche characteristics; a current detector CD detecting a surge current flowing in the test target element by applying the surge voltage to the test target element from the surge-voltage generation circuit SC; and determination unit JUD determining whether electric power equal to or higher than specified electric power is applied to the test target element on the basis of the detected voltage detected by the voltage detector VD and the detected current detected by the current detector CD.
机译:解决的问题:为了确保检测到向测试对象元件施加了规定的浪涌电功率。解决方案:浪涌测试装置包括:施加浪涌电压的浪涌电压产生电路SC;第一测试端子T1连接到浪涌电压生成电路SC的输出。第二测试端子T2接地。电压检测器VD检测从浪涌电压产生电路SC施加到被连接到第一测试端子T1和第二测试端子T2之间的测试对象元件的浪涌电压,以使其被反向偏置并且具有雪崩特性;电流检测器CD通过从浪涌电压产生电路SC向测试目标元件施加浪涌电压来检测在测试目标元件中流动的浪涌电流。判断单元JUD基于电压检测器VD检测到的检测电压和电流检测器CD检测到的检测电流,判断是否向试验对象元件施加了等于或大于规定的电力。

著录项

  • 公开/公告号JP6230894B2

    专利类型

  • 公开/公告日2017-11-15

    原文格式PDF

  • 申请/专利权人 新電元工業株式会社;

    申请/专利号JP20130256180

  • 发明设计人 佐藤 喜市;

    申请日2013-12-11

  • 分类号G01R31/28;G01R31/26;

  • 国家 JP

  • 入库时间 2022-08-21 13:08:22

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