首页> 外国专利> Test image, test image forming system, test image forming method, test image forming program, storage medium, storage medium, abnormal recording element detection system, abnormal recording element detection method, abnormal recording element detection program, storage medium

Test image, test image forming system, test image forming method, test image forming program, storage medium, storage medium, abnormal recording element detection system, abnormal recording element detection method, abnormal recording element detection program, storage medium

机译:测试图像,测试图像形成系统,测试图像形成方法,测试图像形成程序,存储介质,存储介质,异常记录元件检测系统,异常记录元件检测方法,异常记录元件检测程序,存储介质

摘要

The test image is formed in accordance with input data in which a plurality of recording elements selected every N (an integer of 1 or more) pieces in a projected recording element group is indicated as a first recording element and a recording element that is not selected as the first recording element is indicated as a second recording element, the input data allowing: a first-stage pattern to be formed in a recording area of the second recording element in accordance with a second input gradation value; a recording position in the second direction to be sequentially changed; and the first recording element and the second recording element to be sequentially switched to form a second-stage pattern to an (N+1)-th-stage pattern.
机译:根据输入数据形成测试图像,在该输入数据中,将投影的记录元件组中每N个(大于或等于1的整数)个选择的多个记录元件指示为第一记录元件和未选择的记录元件当第一记录元件被指示为第二记录元件时,输入数据允许:根据第二输入灰度值在第二记录元件的记录区域中形成第一阶段图案;以及在第二方向上的记录位置被顺序地改变;第一记录元件和第二记录元件被顺序切换以形成第二级图案至第(N + 1)级图案。

著录项

  • 公开/公告号JP6300699B2

    专利类型

  • 公开/公告日2018-03-28

    原文格式PDF

  • 申请/专利权人 富士フイルム株式会社;

    申请/专利号JP20140207530

  • 发明设计人 浮島 正之;

    申请日2014-10-08

  • 分类号B41J2/01;B41J29/393;

  • 国家 JP

  • 入库时间 2022-08-21 13:07:55

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