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Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, and three-dimensional shape measuring program

机译:三维形状测量装置,三维形状测量方法和三维形状测量程序

摘要

A three-dimensional shape measurement device of the present invention, includes an imaging unit sequentially outputting a captured predetermined two-dimensional image (hereinafter, referred to as a first two-dimensional image), while outputting another two-dimensional image (hereinafter, referred to as a second two-dimensional image) with a setting different from that of the captured first two-dimensional image, according to an output instruction. An output instruction generation unit generates the output instruction on the basis of a shape defect rate in viewing a three-dimensional model from the perspective of having captured the first two-dimensional image, the three-dimensional model being based on the second two-dimensional image outputted by the imaging unit, and a storage unit stores the second two-dimensional image outputted by the imaging unit.
机译:本发明的三维形状测量装置,包括:成像单元,其依次输出所捕获的预定二维图像(在下文中,称为第一二维图像),同时输出另一二维图像(在下文中,称为第一二维图像)。根据输出指令,将其设置为与所捕获的第一二维图像的设置不同的第二二维图像。输出指令生成单元基于从捕获第一二维图像的角度来看三维模型时基于形状缺陷率生成输出指令,该三维模型基于第二二维成像单元输出的第二图像,以及存储单元,存储成像单元输出的第二二维图像。

著录项

  • 公开/公告号JP6304244B2

    专利类型

  • 公开/公告日2018-04-04

    原文格式PDF

  • 申请/专利权人 凸版印刷株式会社;

    申请/专利号JP20150512469

  • 发明设计人 運天 弘樹;石井 達也;

    申请日2014-04-14

  • 分类号G01B11/245;G06T1;

  • 国家 JP

  • 入库时间 2022-08-21 13:07:21

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