首页> 外国专利> NOTCHED FIN STRUCTURES AND METHODS OF MANUFACTURE

NOTCHED FIN STRUCTURES AND METHODS OF MANUFACTURE

机译:缺刻鳍结构和制造方法

摘要

The present disclosure relates to semiconductor structures and, more particularly, to notched fin structures and methods of manufacture. The structure includes: a fin structure composed of a substrate material and a stack of multiple epitaxially grown materials on the substrate material; a notch formed in a first epitaxially grown material of the stack of multiple epitaxially grown materials of the fin structure; an insulator material within the notch of the fin structure; and an insulator layer surrounding the fin structure and above a surface of the notch.
机译:本公开涉及半导体结构,并且更具体地,涉及带缺口的鳍结构和制造方法。该结构包括:鳍片结构,由基板材料和在基板材料上的多种外延生长材料的堆叠构成;在鳍状结构的多个外延生长材料的堆叠的第一外延生长材料中形成的切口;鳍状结构的凹口内的绝缘体材料;绝缘层围绕鳍结构并且在凹口的表面上方。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号