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SYSTEMS AND METHODS FOR FORMING LOW RESISTIVITY METAL CONTACTS AND INTERCONNECTS BY REDUCING AND REMOVING METALLIC OXIDE

机译:通过还原和去除金属氧化物形成低电阻率金属接触和互连的系统和方法

摘要

A method for depositing a metal layer on a barrier layer includes a) arranging a substrate in a processing chamber. The substrate has been exposed to at least one of air and/or oxidizing chemistry and includes a barrier layer and one or more underlying layers, wherein the barrier layer includes a material selected from a group consisting of tantalum nitride, titanium nitride, tantalum and titanium. The method includes b) supplying a gas selected from a group consisting of hydrazine, a gas including fluorine species, a gas including chlorine species, derivatives of hydrazine, ammonia, carbon monoxide, a gas including amidinates, and/or a gas including metal organic ligands to the processing chamber for a predetermined period to remove oxidation from the barrier layer. The method includes c) depositing a metal layer on the barrier layer after b). The metal layer includes a metal selected from a group consisting of cobalt, copper, tungsten, ruthenium, rhodium, molybdenum, and nickel.
机译:在阻挡层上沉积金属层的方法包括:a)将基板布置在处理室中。所述衬底已经暴露于空气和/或氧化化学中的至少一种,并且包括阻挡层和一个或多个下面的层,其中所述阻挡层包括选自由氮化钽,氮化钛,钽和钛组成的组的材料。 。该方法包括b)供应选自以下的气体:肼,包括氟的气体,包括氯的气体,肼的衍生物,氨,一氧化碳,包括mid酸盐的气体和/或包括有机金属的气体。配体在预定的时间内进入处理室,以去除阻挡层的氧化。该方法包括c)在b)之后在阻挡层上沉积金属层。金属层包括选自由钴,铜,钨,钌,铑,钼和镍组成的组的金属。

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