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SYSTEMS AND METHODS FOR FORMING LOW RESISTIVITY METAL CONTACTS AND INTERCONNECTS BY REDUCING AND REMOVING METALLIC OXIDE

机译:通过还原和去除金属氧化物形成低电阻率金属接触和互连的系统和方法

摘要

A method for depositing a metal layer on a barrier layer includes the step of: a) arranging a substrate in a processing chamber. The substrate is exposed to at least one of air and/or an oxidizing chemical substance, and includes a barrier layer and one or more lower layers, wherein the barrier layer includes a material selected from the group consisting of tantalum nitride, titanium nitride, tantalum, and titanium. The method includes the step of: b) supplying a gas selected from the group consisting of hydrazine, a gas including fluorine species, a gas including chlorine species, derivatives of hydrazine, ammonia, carbon monoxide, a gas including amidinates, and/or a gas including metal organic ligands to the processing chamber for a predetermined period to remove oxidation from the barrier layer. The method includes the step of: c) depositing the metal layer on the barrier layer after the step b). The metal layer includes a metal selected from the group consisting of cobalt, copper, tungsten, ruthenium, rhodium, molybdenum, and nickel.
机译:在阻挡层上沉积金属层的方法包括以下步骤:a)在处理室中布置衬底。所述基板暴露于空气和/或氧化性化学物质中的至少一种,并且包括阻挡层和一个或多个下层,其中所述阻挡层包括选自由氮化钽,氮化钛,钽组成的组的材料。和钛。该方法包括以下步骤:b)供应选自肼,包括氟的气体,包括氯的气体,肼的衍生物,氨,一氧化碳的气体,和包括mid胺的气体,和/或包括金属有机配体的气体在预定的时间内进入处理室,以去除阻挡层的氧化。该方法包括以下步骤:c)在步骤b)之后在阻挡层上沉积金属层。金属层包括选自由钴,铜,钨,钌,铑,钼和镍组成的组的金属。

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