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Particle beam microscope and method for operating a particle beam microscope

机译:粒子束显微镜和用于操作粒子束显微镜的方法

摘要

A method for operating a particle beam microscope includes: setting potentials of a particle source and an object; directing a particle beam onto the object; setting an excitation of a particle-optical lens; generating a dependence between a manipulated variable and the excitation so that the excitation is representable as a monotonic function dependent on the manipulated variable; changing the manipulated variable via an actuating element to focus the particle beam at the object; and determining a target value of the manipulated variable in a manner dependent on the set potentials. The target value virtually corresponds to an ideal excitation of the lens. The particle beam in the case of the ideal excitation is focused at the object. The absolute value of the first derivative of the function in a value range containing the target value is less than in the case of values lying outside of this value range.
机译:一种操作粒子束显微镜的方法,包括:设置粒子源和物体的电势;将粒子束对准物体;设置粒子光学透镜的激发;产生受控变量和激励之间的依赖关系,从而激励可以表示为依赖于受控变量的单调函数;通过操纵元件改变操纵变量,以将粒子束聚焦在物体上;并以取决于设定电位的方式确定调节变量的目标值。目标值实际上对应于透镜的理想激发。在理想激发的情况下,粒子束聚焦在物体上。在包含目标值的值范围内,函数的一阶导数的绝对值小于该值范围外的值的情况。

著录项

  • 公开/公告号US10062542B2

    专利类型

  • 公开/公告日2018-08-28

    原文格式PDF

  • 申请/专利权人 CARL ZEISS MICROSCOPY GMBH;

    申请/专利号US201615010046

  • 发明设计人 DIRK PREIKSZAS;

    申请日2016-01-29

  • 分类号H01J37/28;H01J37/21;

  • 国家 US

  • 入库时间 2022-08-21 13:03:01

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