首页> 外国专利> Multi-fin FINFET device including epitaxial growth barrier on outside surfaces of outermost fins and related methods

Multi-fin FINFET device including epitaxial growth barrier on outside surfaces of outermost fins and related methods

机译:在最外鳍的外表面上包括外延生长势垒的多鳍FINFET器件及相关方法

摘要

A multi-fin FINFET device may include a substrate and a plurality of semiconductor fins extending upwardly from the substrate and being spaced apart along the substrate. Each semiconductor fin may have opposing first and second ends and a medial portion therebetween, and outermost fins of the plurality of semiconductor fins may comprise an epitaxial growth barrier on outside surfaces thereof. The FINFET may further include at least one gate overlying the medial portions of the semiconductor fins, a plurality of raised epitaxial semiconductor source regions between the semiconductor fins adjacent the first ends thereof, and a plurality of raised epitaxial semiconductor drain regions between the semiconductor fins adjacent the second ends thereof.
机译:多鳍FINFET器件可以包括衬底和从衬底向上延伸并且沿着衬底间隔开的多个半导体鳍。每个半导体鳍可以具有相对的第一端和第二端以及在它们之间的中间部分,并且多个半导体鳍中的最外鳍可以在其外表面上包括外延生长阻挡层。 FINFET还可包括:至少一个栅极,其覆盖在半导体鳍的中间部分上;多个凸起的外延半导体源极区域,在其第一端附近的半导体鳍之间;以及多个凸起的外延半导体漏极区域,在相邻的半导体鳍之间。其第二端。

著录项

  • 公开/公告号US10062690B2

    专利类型

  • 公开/公告日2018-08-28

    原文格式PDF

  • 申请/专利权人 STMICROELECTRONICS INC.;

    申请/专利号US201615209662

  • 发明设计人 QING LIU;PRASANNA KHARE;NICOLAS LOUBET;

    申请日2016-07-13

  • 分类号H01L29/76;H01L21/336;H01L27/088;H01L21/8238;H01L21/84;H01L29/66;H01L29/78;H01L29/08;H01L21/265;H01L29/417;H01L21/225;H01L21/8234;

  • 国家 US

  • 入库时间 2022-08-21 13:02:58

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