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B-TRAN Geometry and Structure That Provides Both High Gain and High Current Density

机译:提供高增益和高电流密度的B-TRAN几何结构

摘要

Three optimizations are provided for B-TRAN devices which include field plate trenches: 1) the trench dielectric thickness is large enough to withstand the base-to-emitter voltage, but thin enough to provide good electrical coupling between the poly field plate and the adjacent p-type silicon; 2) the base contact width is small enough to provide an acceptably low reverse base contact region pinch-off voltage, but large enough to avoid degradation of both base resistance; and 3) the emitter width is small enough to keep an acceptably high current density at the emitter's center.
机译:为B-TRAN器件提供了三个优化方案,其中包括场板沟槽:1)沟槽的电介质厚度足够大以承受基极-发射极电压,但又要足够薄以在多晶硅场板与相邻场板之间提供良好的电耦合p型硅; 2)基极接触宽度小到足以提供可接受的低反向基极接触区域夹断电压,但又足够大以避免两个基极电阻的降低; 3)发射极的宽度足够小,可以在发射极的中心保持可接受的高电流密度。

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