首页> 外国专利> BULK NANOFABRICATION WITH SINGLE ATOMIC PLANE PRECISION VIA ATOMIC-LEVEL SCULPTING OF CRYSTALLINE OXIDES

BULK NANOFABRICATION WITH SINGLE ATOMIC PLANE PRECISION VIA ATOMIC-LEVEL SCULPTING OF CRYSTALLINE OXIDES

机译:结晶氧化物的原子级刻蚀与单原子平面精密度的本体纳米化

摘要

A method for sculpting crystalline oxide structures for bulk nanofabrication is provided. The method includes the controlled electron beam induced irradiation of amorphous and liquid phase precursor solutions using a scanning transmission electron microscope. The atomically focused electron beam includes operating parameters (e.g., location, dwell time, raster speed) that are selected to provide a higher electron dose in patterned areas and a lower electron dose in non-patterned areas. Concurrently with the epitaxial growth of crystalline features, the present method includes scanning the substrate to provide information on the size of the crystalline features with atomic resolution. This approach provides for atomic level sculpting of crystalline oxide materials from a metastable amorphous precursor and the liquid phase patterning of nanocrystals.
机译:提供了一种雕刻晶体氧化物结构以进行整体纳米制造的方法。该方法包括使用扫描透射电子显微镜对非晶态和液相前体溶液进行受控的电子束诱导辐照。原子聚焦的电子束包括操作参数(例如,位置,停留时间,光栅速度),选择这些操作参数以在图案化区域中提供较高的电子剂量,而在非图案化区域中提供较低的电子剂量。与晶体特征的外延生长同时,本方法包括扫描基板以提供关于具有原子分辨率的晶体特征的尺寸的信息。该方法提供了亚稳态无定形前体的结晶氧化物材料的原子级雕刻以及纳米晶体的液相图案化。

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