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Inspection systems with two X-ray scanners in a first stage inspection system
Inspection systems with two X-ray scanners in a first stage inspection system
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机译:一级检查系统中带有两个X射线扫描仪的检查系统
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摘要
This invention is directed towards finding, locating, and confirming threat items and substances. The inspection system is designed to detect objects that are made from, but not limited to, special nuclear materials (“SNM”) and/or high atomic number materials. The system employs advanced image processing techniques to analyze images of an object under inspection (“OUI”), which includes, but is not limited to baggage, parcels, vehicles and cargo, and fluorescence detection.
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