首页> 外国专利> ELECTROMIGRATION CHECK IN LAYOUT DESIGN USING COMPILED RULES LIBRARY

ELECTROMIGRATION CHECK IN LAYOUT DESIGN USING COMPILED RULES LIBRARY

机译:使用规则库对布局设计中的电迁移检查

摘要

This application discloses a computing system to receive electromigration design rules defining characteristics of integrated circuits configured to cause electromigration, generate a rules library including machine code implementing electromigration design rule checks for the characteristics defined by the electromigration design rules, and perform the electromigration design rule checks on a layout design of an integrated circuit by executing the machine code implementing the electromigration design rule checks on structures of the integrated circuit described in the layout design. The computing system can generate the rules library at runtime by parsing the electromigration design rules to identify the characteristics of integrated circuits configured to cause electromigration, translating the electromigration design rules into an intermediate format based on the identified characteristics of integrated circuits, expanding macro instructions in the intermediate file into the source code, and compiling the source code into machine code for population into the rules library.
机译:该申请公开了一种计算系统,该计算机系统接收定义用于配置成引起电迁移的集成电路的特征的电迁移设计规则,生成包括对电迁移设计规则定义的特征实施电迁移设计规则检查的机器代码的规则库,并执行电迁移设计规则检查通过执行实现电子迁移设计规则的机器代码对集成电路的布局设计进行检查,以检查布局设计中描述的集成电路的结构。计算系统可以在运行时通过解析电迁移设计规则以识别配置为引起电迁移的集成电路的特征,基于所识别的集成电路的特征将电迁移设计规则转换为中间格式,在其中扩展宏指令,来生成规则库。将中间文件转换为源代码,然后将源代码编译为机器代码,以填充到规则库中。

著录项

  • 公开/公告号US2018210995A1

    专利类型

  • 公开/公告日2018-07-26

    原文格式PDF

  • 申请/专利权人 MENTOR GRAPHICS CORPORATION;

    申请/专利号US201715411839

  • 发明设计人 KAUSHIK PATRA;

    申请日2017-01-20

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 12:58:35

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