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METHOD OF ELIMINATING FAULTS IN A SEMICONDUCTOR FILM COMPRISING THE FORMATION OF A HYDROGEN TRAPPING LAYER
METHOD OF ELIMINATING FAULTS IN A SEMICONDUCTOR FILM COMPRISING THE FORMATION OF A HYDROGEN TRAPPING LAYER
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机译:消除包含氢陷阱层形成的半导体膜中的故障的方法
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摘要
The invention relates to a method of treating a thin film transferred from a donor substrate to a receiver substrate by fracture at the level of a zone of the donor substrate which is made fragile by hydrogen ion implantation. The method includes a step of thinning the transferred thin film so as to eliminate a region of residual defects induced by the hydrogen ion implantation. The method also includes, directly after the fracture and before the step of thinning of the transferred thin film, a step of forming a hydrogen trapping layer in the region of residual defects of the transferred thin film. A thermal processing may be implemented after formation of the hydrogen trapping layer and before thinning of the thin film.
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