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Device quality metrics using unsatisfied parity checks
Device quality metrics using unsatisfied parity checks
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机译:使用不满意的奇偶校验检查的设备质量指标
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摘要
An apparatus includes a memory and a controller. The memory may be configured to store data. The controller may be configured to process a plurality of read/write operations to/from the memory, receive a codeword from the memory, generate a plurality of syndromes of the codeword at a plurality of possible code rates, generate a plurality of count values by counting a number of unsatisfied parity checks in each of the plurality of syndromes, generate a plurality of normalized values by dividing the plurality of count values by a plurality of lengths of the plurality of possible code rates respectively, and determine a bit error rate value of the memory based on a lowest value among the plurality of normalized values.
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