首页> 外国专利> Systems and methods for structured illumination super-resolution phase microscopy

Systems and methods for structured illumination super-resolution phase microscopy

机译:用于结构化照明超分辨率相显微镜的系统和方法

摘要

Systems and methods for structured illumination super-resolution phase microscopy are disclosed. According to an aspect, an imaging system includes a light source configured to generate light. The system also includes a diffraction grating positioned to receive and diffract the output light. The system also includes a sample holder positioned to receive the diffracted light for transmission through a sample. Further, the system includes an image detector positioned to receive the light transmitted through the sample and configured to generate image data based on the received light. The system also includes a computing device configured to apply subdiffraction resolution reconstruction to the image data for generating an image of the sample.
机译:公开了用于结构化照明超分辨率相显微镜的系统和方法。根据一个方面,一种成像系统包括被配置为产生光的光源。该系统还包括衍射光栅,其定位成接收和衍射输出光。该系统还包括样品架,该样品架定位成接收衍射光以透射通过样品。此外,该系统包括图像检测器,该图像检测器定位成接收透射通过样品的光并且被配置为基于接收到的光来生成图像数据。该系统还包括计算设备,该计算设备被配置为将亚衍射分辨率重构应用于图像数据以生成样本的图像。

著录项

  • 公开/公告号US9864183B2

    专利类型

  • 公开/公告日2018-01-09

    原文格式PDF

  • 申请/专利权人 DUKE UNIVERSITY;

    申请/专利号US201414250846

  • 发明设计人 JOSEPH A. IZATT;SHWETADWIP CHOWDHURY;

    申请日2014-04-11

  • 分类号G02B21/36;G02B5/18;G02B21/06;H04N5/225;G02B21/08;G02B21/14;

  • 国家 US

  • 入库时间 2022-08-21 12:54:36

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号