首页> 外国专利> CORRECTING PHOTON COUNTS IN A PHOTON COUNTING X-RAY RADIATION DETECTION SYSTEM

CORRECTING PHOTON COUNTS IN A PHOTON COUNTING X-RAY RADIATION DETECTION SYSTEM

机译:在光子计数X射线辐射检测系统中校正光子计数

摘要

The invention relates to a photon counting x-ray radiation detection system. The system (31) comprises an x-ray radiation device (2) for providing polychromatic x-ray radiation (4) for traversing an examination zone (5) during a detection period of a scan.A photon counting detection device (6) comprising detection elements (3) detects the x-ray radiation after having traversed the examination zone and measures for each detection element photon counts in one or more energy bins during the detection period. A correction unit (12) estimates for each detection element an amount of a build up charge present in the detection element and corrects the measured photon counts for the detection element based on the estimated amount of the build up charge. This allows the corruption of the photon count rates caused by the build up charges to be compensated and to improve the determination of the photon counts.
机译:本发明涉及光子计数X射线辐射检测系统。系统(31)包括用于提供多色X射线辐射(4)以在扫描的检测周期期间穿过检查区域(5)的X射线辐射设备(2)。光子计数检测设备(6)包括检测元件(3)在穿过检查区域后检测X射线辐射,并在检测期间测量每个检测元件在一个或多个能量仓中的光子计数。校正单元(12)针对每个检测元件估计存在于检测元件中的累积电荷的量,并且基于所估计的累积电荷量来校正针对检测元件的测得的光子计数。这允许补偿由累积电荷引起的光子计数率的恶化,并改善光子计数的确定。

著录项

  • 公开/公告号IN201847012561A

    专利类型

  • 公开/公告日2018-04-27

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN201847012561

  • 发明设计人 THRAN AXEL;DAERR HEINER;

    申请日2018-04-03

  • 分类号G01T1/24;

  • 国家 IN

  • 入库时间 2022-08-21 12:51:44

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