首页> 外国专利> APPARATUS AND METHOD FOR IDENTIFYING DEFECTS AND DETERMINING DEFECT DEPTH IN FERROMAGNETIC STRUCTURES BASED ON MAGNETIC FLUX LEAKAGE

APPARATUS AND METHOD FOR IDENTIFYING DEFECTS AND DETERMINING DEFECT DEPTH IN FERROMAGNETIC STRUCTURES BASED ON MAGNETIC FLUX LEAKAGE

机译:基于磁通量泄漏的铁磁结构缺陷识别和深度确定的装置和方法

摘要

The system and method involve a permanent magnetization induction process for ferromagnetic structures, carried out to the saturation point to overwhelm the intrinsic magnetic fields in the structures. The permanent magnetization to overwhelm the intrinsic magnetization eliminates the effect of intrinsic fields for subsequent measurements. The permanent magnetization along a hollow structure yields two residual magnetic field components: axial and circumferential. The circumferential component varies as a function of depth. Thus, an analysis system can analyze defects and the depth of those defects by detecting the direction of the magnetic flux leakage around the defects. This can further be performed at a distance from the structures.
机译:该系统和方法包括用于铁磁结构的永久磁化感应过程,该过程进行到饱和点以压倒结构中的固有磁场。永久磁化使本征磁化不堪重负,消除了本征场对后续测量的影响。沿空心结构的永久磁化产生两个残余磁场分量:轴向和圆周。圆周分量随深度而变化。因此,分析系统可以通过检测缺陷周围的磁通泄漏的方向来分析缺陷和那些缺陷的深度。这可以进一步在距结构一定距离处执行。

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