IMAGE PROCESSING-BASED INSULATOR DEFECT DETECTION METHOD AND SYSTEM

摘要

The present invention relates to an image processing-based insulator defect detection method and system. An image including an insulator is transformed from an RGB color space into an HIS color space, and segmentation is performed to obtain single-channel images of a tone component and a saturation component. Intersection taking is performed to extract an insulator contour, and then morphological corrosion, dilation operation, regional growth, and connected region labeling are performed on an operator using an oval as a structural element in an insulator contour image. According to areas of all connected regions, a non-insulator image is removed from the image obtained after the regional growth operation to obtain a pseudo standard binary image. The image obtained after closing operation is compared with the pseudo standard binary image and an insulator defect is determined on the basis of the comparison result. The method is easy to achieve, operations are simple, and operation speed is high.