METHOD FOR MELTING CURVES ANALYSIS USING BIFUNCTIONAL PNA PROBE, AND METHOD FOR DIAGNOSING MICROSATELLITE INSTABILITY AND KIT FOR DIAGNOSING MICROSATELLITE INSTABILITY USING SAME

摘要

The present invention relates to a method for melting curve analysis using a bifunctional PNA probe, and a method for diagnosing microsatellite instability and a kit for diagnosing microsatellite instability using the same. More specifically, the present invention relates to: a method for melting curve analysis according to the structure of a fluorescent PNA probe bound with different bonding strengths according to the number of deleted base mutations by using a fluorescent PNA probe capable of being specifically bound to a region in which the same bases are repeated; and a diagnosis method capable of rapidly and accurately determining microsatellite instability by detecting a gene mutation in a microsatellite marker generated by a base deletion in a region, in which the same bases are repeated, by said analysis method and by analyzing the number of base mutations that occur as a result. According to the present invention, it is possible to analyze whether a microsatellite marker gene has been deleted with high sensitivity by using five microsatellite markers that are in quasi loci and have high sensitivity and specificity, and thus costs can be reduced and the time required for examination can be reduced compared to existing MSI diagnosis methods.