IMAGE SENSOR HAVING TEST PATTERN AND METHOD FOR CORRECTING OFFSET OF IMAGE SENSOR USING SAME

摘要

The present technology relates to an image sensor having a test pattern and a method for correcting an offset of an image sensor using the same. According to an embodiment of the present invention, the image sensor comprises: an active pixel region on a substrate; and a test pattern region adjacent to the active pixel region. The active pixel region includes a first channel between a first photodiode and a floating diffusion, and a first transmission gate electrode on the first channel. The test pattern region includes a second channel between a first test photodiode and a test floating diffusion, a first test transmission gate electrode on the second channel, and a first contact plug connected to the first test photodiode. Each of the first test photodiode, the test floating diffusion, the second channel, and the first test transmission gate electrode may have substantially the same alignment error as each of the first photodiode, the floating diffusion, the first channel, and the first transmission gate electrode.;COPYRIGHT KIPO 2018