CELL-AWARE DEFECT CHARACTERIZATION AND WAVEFORM ANALYSIS USING MULTIPLE STROBE POINTS

摘要

Disclosed is a method for implementing a computer for characterizing a circuit, which comprises a step of receiving, by a computer, data representing a circuit and at least one defect of the circuit. The method of the present invention further comprises the steps of: simulating the circuit to obtain a first timing characteristic by using the computer; and simulating the circuit having at least one defect to obtain a second timing characteristic by using the computer. The method of the present invention further comprises a step of identifying, by using the computer, correlation between at least one test vector and the defect in accordance with a plurality of strobes applied during a first time interval and associated with the first timing characteristic, the second timing characteristic, and the test vector when the computer is applied to characterize the circuit. According to the present invention, a circuit defect is automatically characterized by using a plurality of strobes during the standard cell characterization.