Cell-aware defect characterization and waveform analysis using multiple strobe points

摘要

A computer-implemented method for characterizing a circuit is presented. The method includes receiving, by the computer, data representative of the circuit and at least one defect of the circuit. The method further includes simulating, using the computer, the circuit to obtain a first timing characteristic, and simulating, using the computer, the circuit with the at least one defect to obtain a second timing characteristic. The method further includes identifying, using the computer, an association between at least one test vector and the at least one defect in accordance with the first timing characteristic, the second timing characteristic, and a multitude of strobes applied during a first time interval associated with the at least one test vector, when the computer is invoked to characterize the circuit.