CELL-AWARE DEFECT CHARACTERIZATION AND WAVEFORM ANALYSIS USING MULTIPLE STROBE POINTS

摘要

A computer implemented method for characterizing a circuit is presented. The method includes the step of the computer receiving data indicating at least one defect of the circuit and the circuit. The method includes simulating the circuit to obtain a first timing characteristic using the computer, and using the computer to simulate a circuit having the at least one defect to obtain a second timing characteristic . The method may further comprise the steps of: when the computer is applied to characterizing the circuit, applying a plurality of strobe signals applied during a first time interval associated with the at least one test vector and the first timing characteristic, Identifying a relationship between the at least one test vector and the at least one defect according to the at least one test vector.