首页> 外国专利> method of measuring optical properties of high power LED and apparatus for measuring optical properties of high power LED

method of measuring optical properties of high power LED and apparatus for measuring optical properties of high power LED

机译:大功率LED的光学特性的测量方法以及大功率LED的光学特性的测量装置

摘要

The present invention relates to a method for measuring optical characteristics of a high-power LED, which improves measurement repeatability and enables stable measurement, and a measuring apparatus thereof. The method for measuring optical characteristics of a high-power LED according to an embodiment of the present invention comprises the steps of: obtaining a junction voltage and a junction temperature of an LED for reference setting from an instantaneous response curve of the LED for reference setting by time zone; searching for a control range of the junction temperature for the junction voltage to be maintained constant within a stable time zone of the instantaneous response curve; applying power to an LED for inspection and controlling the junction temperature within the searched control range of the junction temperature so that a junction voltage of the LED for inspection is maintained constant within the stable time zone; and measuring optical characteristics of the LED for inspection within the stable time zone.
机译:高功率LED的光学特性的测量方法及其测量装置技术领域本发明涉及一种提高了测量重复性并能够进行稳定测量的高功率LED的光学特性的测量方法及其测量装置。根据本发明实施例的用于测量大功率LED的光学特性的方法包括以下步骤:从用于参考设置的LED的瞬时响应曲线获得用于参考设置的LED的结电压和结温度。按时区;寻找结温的控制范围,以使结电压在瞬时响应曲线的稳定时间段内保持恒定;向用于检查的LED供电并在搜索到的结温控制范围内控制结温度,以使得用于检查的LED的结电压在稳定的时区内保持恒定;在稳定的时间段内测量LED的光学特性以进行检查。

著录项

  • 公开/公告号KR20180041279A

    专利类型

  • 公开/公告日2018-04-24

    原文格式PDF

  • 申请/专利权人 WITHLIGHT CO. LTD.;

    申请/专利号KR20160132563

  • 发明设计人 PARK SUNG LIM;

    申请日2016-10-13

  • 分类号G01R31/26;G01J1/02;G01J1/42;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 12:40:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号