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REFERENCE DEVICE MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD COATING DEVICE MEASUREMENT ACCURACY ASSURANCE METHOD OF MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD AND METHOD FOR PRODUCING COATING FILM
REFERENCE DEVICE MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD COATING DEVICE MEASUREMENT ACCURACY ASSURANCE METHOD OF MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD AND METHOD FOR PRODUCING COATING FILM
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机译:用光谱干涉法测量器件的参考装置涂层测量法用光谱干涉法测量器件的精度保证方法和生产涂膜的方法
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摘要
A reference device comprises a first non-transparent block body having a groove portion; and a second transparent block body stacked on the first block body. Moreover, light is irradiated on the groove portion of the first block body through the second block body by a measuring device using a spectroscopic interference method, and predetermined interference light corresponding to a depth of the groove portion is formed by reflection light from a surface at the first block body of the second block body and reflection light from a bottom surface of the groove portion.
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