首页> 外国专利> REFERENCE DEVICE MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD COATING DEVICE MEASUREMENT ACCURACY ASSURANCE METHOD OF MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD AND METHOD FOR PRODUCING COATING FILM

REFERENCE DEVICE MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD COATING DEVICE MEASUREMENT ACCURACY ASSURANCE METHOD OF MEASURING DEVICE USING SPECTROSCOPIC INTERFERENCE METHOD AND METHOD FOR PRODUCING COATING FILM

机译:用光谱干涉法测量器件的参考装置涂层测量法用光谱干涉法测量器件的精度保证方法和生产涂膜的方法

摘要

A reference device comprises a first non-transparent block body having a groove portion; and a second transparent block body stacked on the first block body. Moreover, light is irradiated on the groove portion of the first block body through the second block body by a measuring device using a spectroscopic interference method, and predetermined interference light corresponding to a depth of the groove portion is formed by reflection light from a surface at the first block body of the second block body and reflection light from a bottom surface of the groove portion.
机译:基准装置包括具有槽部的第一非透明块体;和第二透明块体堆叠在第一块体上。另外,通过使用光谱干涉法的测量装置,使光经由第二块体经由第二块体照射在第一块体的槽部上,通过来自表面的反射光形成与槽部的深度对应的预定的干涉光。第二块体的第一块体和来自凹槽部分的底表面的反射光。

著录项

  • 公开/公告号KR20180052510A

    专利类型

  • 公开/公告日2018-05-18

    原文格式PDF

  • 申请/专利权人 NITTO DENKO CORPORATION;

    申请/专利号KR20170100139

  • 发明设计人 MICHIHIRA HAJIME;KONDO SHIN;

    申请日2017-08-08

  • 分类号G01B11/06;G01J3/45;

  • 国家 KR

  • 入库时间 2022-08-21 12:40:06

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