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Method of Fabricating nano pattern using high etching contrast materials involving carborane complex

机译:使用涉及碳硼烷配合物的高蚀刻对比材料制造纳米图案的方法

摘要

The present invention relates to a manufacturing method of a nanopattern using a high etching contrast material including a carborane complex. More specifically, the present invention uses a carborane complex having a strong oxygen etching resistance as a high etching contrast material in a nanopattern manufacturing process, and manufactures a nanopattern having a high integration degree by etching a substrate forming a mask pattern formed by using an induced self-assembly. Therefore, the nanopattern of the present invention can have a high aspect ratio in the oxygen etching, and an ultra-high integration degree nanopattern having a line width of 15 nm or less can be manufactured. The manufacturing method of a nanopattern comprises the following steps of: forming the mask pattern by the self-assembly of a block copolymer having a nitrogen group on the substrate; forming a high etching contrast film covering the mask pattern by a dipping method; and etching the substrate on which the mask pattern in which the high etching contrast film is formed is formed by an oxygen drying etching method, and forming the nanopattern on the upper part of the substrate.
机译:本发明涉及使用包括碳硼烷络合物的高蚀刻对比材料的纳米图案的制造方法。更具体地,本发明在纳米图案制造工艺中使用具有强的耐氧蚀刻性的碳硼烷络合物作为高蚀刻对比材料,并且通过蚀刻形成通过使用诱导形成的掩模图案的基板来制造具有高集成度的纳米图案。自组装。因此,本发明的纳米图案可以在氧蚀刻中具有高的纵横比,并且可以制造线宽为15nm以下的超高集成度纳米图案。纳米图案的制造方法包括以下步骤:通过在基板上自组装具有氮基的嵌段共聚物形成掩模图案;通过浸渍法形成覆盖掩模图案的高蚀刻对比膜;通过氧气干燥蚀刻法蚀刻形成有形成有高蚀刻对比度膜的掩模图案的基板,并在该基板的上部形成纳米图案。

著录项

  • 公开/公告号KR101850010B1

    专利类型

  • 公开/公告日2018-04-19

    原文格式PDF

  • 申请/专利权人 KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY;

    申请/专利号KR20160166216

  • 发明设计人 HONG SUNG WOO;HONG PYONG HWA;

    申请日2016-12-07

  • 分类号G03F7;G03F7/033;G03F7/16;H01L21/027;H01L21/311;H01L21/3213;

  • 国家 KR

  • 入库时间 2022-08-21 12:37:58

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