The present invention relates to a method of measuring an image using an image measurement apparatus based on a visible/near infrared (VIS/NIR) microscopy hyperspectral imager. The method includes: a displacement stage capable of moving a measurement plate provided with a sample in X and Y axis directions; an object lens provided on the measurement plate to adjust a distance to the measurement plate, into which an image of the sample is inputted; a long pass filter provided on the object lens to transmit light of a long wavelength; an achromatic lens provided on the long pass filter to remove chromatic aberration of the light passing through the long pass filter; an entrance slit into which the light passing through the achromatic lens enters; a collimator mirror for reflecting the light passing through the entrance slit by parallel light; a diffraction plate for diffracting the light, reflected by the collimator mirror, according to a wavelength of corresponding light; a light concentration mirror for collecting and reflecting the light, diffracted by the diffraction plate; and a detector for measuring a hyperspectral spectrum reflected by the light concentration mirror. Since a method for nondestructively measuring an image based on a VIS/NIR microscopy hyperspectral imager acquires image information of a measurement target object by acquiring hyperspectral images, which can be measured in a VIS/NIR band, by a wavelength band, there is an effect of implementing and classifying a three-dimensional stack structure such as a semiconductor module or an inner structure of a sample in which heterogeneous materials are compositively configured as an image of each wavelength band.;COPYRIGHT KIPO 2018
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