DEVICE FOR MEASURING REFLECTION AND EMISSION COEFFICIENTS OF MATERIALS AND COATINGS

摘要

FIELD: optical system; measurement equipment.;SUBSTANCE: invention relates to optical measuring technique. Device for measuring the reflection and emission coefficients of materials and coatings consists of: from a mirror ellipsoid with an aperture made at an angle of 5–20° to its axis, intended for introducing radiation onto a sample, the plane of which passes through the lower focus of the ellipsoid; small integrating sphere with a pyroelectric receiver of radiation, the sensitive surface of which is located on the surface of the sphere; and a screen designed to eliminate the direct hit of radiation reflected from the surface of the sample on the photodetector. As a source of radiation, a modulator and a mirror contains a compact, modulated by an electric current low-inertia infrared emitter whose modulation frequency is synchronized with the sample rate of the ADC of the recording device.;EFFECT: technical result of the invention is the linear dependence of the recording signal of the pyroelectric receiver on the power of the radiation reflected from the sample, which does not depend on the indicatrix of the reflection of the sample, ensuring equality of conditions for samples with a mirror and diffuse reflection character.;5 cl, 6 dwg