首页> 外文会议>2019 IEEE 39th International Conference on Electronics and Nanotechnology >The Heat Exchange Simulation In The Device For Measuring The Emissivity Of Coatings And Material Surfaces
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The Heat Exchange Simulation In The Device For Measuring The Emissivity Of Coatings And Material Surfaces

机译:涂层和材料表面发射率测量装置中的热交换模拟

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The simulation of heat exchange in the working chamber of the device for measuring emissivity was carried. It was shown that the simulation results coincide well with the experimental results. Established that, with the selected technical parameters, the contribution of the conductive-convective component of heat exchange does not exceed 0.1% of the radiation component, and therefore the measurement can be carried out without vacuuming the working chamber. Found suitable area for measurement of emissivity with unevenness of the heat flux distribution, which does not exceed ± 2%.
机译:进行了用于测量发射率的装置的工作室中的热交换的模拟。结果表明,仿真结果与实验结果吻合良好。建立了具有选定技术参数的热交换的传导-对流成分的贡献不超过辐射成分的0.1%,因此可以在不抽真空的情况下进行测量。找到适合测量辐射率且热通量分布不均匀(不超过±2%)的区域。

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