Method and apparatus for quantifying effects of temperature in periods of inactivity on an electrical energy storage device

摘要

A method of quantifying an effect of a temperature during a period of inactivity of operating an electrical energy storage device on a life expectancy of the electrical energy storage device, comprising the steps of: Determining a weighted average temperature of the electrical energy storage device during the idle period based on an average temperature of the electrical energy storage device during the idle period and a temperature of the electrical energy storage device substantially simultaneously with the beginning of the idle period; and Determining a quiescent temperature factor for the electrical energy storage device based on the weighted average temperature of the device during the idle period, wherein determining the quiescent temperature factor comprises: decreasing a predetermined quiescent temperature factor when the weighted average temperature during the idle period is less than one Nominal temperature is, and increasing a predetermined quiescent temperature factor when the weighted average temperature is higher than the nominal temperature.