HIGH POWER LASER DIODE TEST SYSTEM AND METHOD OF MANUFACTURE

摘要

A high power laser diode test system is disclosed which includes a housing body defining at least one device test module compartment therein, a power supply, the system controller, and thermal control system positioned within the device test module compartment, a device test module having at least one carrier device receiver formed therein detachably coupled to the housing body, and at least one carrier device configured to support at least one laser diode device coupled thereto detachably positioned within the carrier device port formed on the device test module.