High power laser diode test system and manufacturing method

摘要

A high power laser diode test system is disclosed, the high power laser diode test system including a housing in which at least one device test module compartment is defined, the high power laser diode test system comprising a device test module The device includes a power supply, a system controller, and a thermal control system disposed in the compartment and includes a device test module in which at least one carrier device receptacle is removably coupled to the housing body. The high power laser diode test system further includes at least one carrier device, wherein the at least one carrier device is within a carrier device port formed in the device test module. It is configured to support at least one laser diode device coupled to the carrier device removably positioned state.